This textbook provides an lntroduction to surface physics， a growing branch of condensed matter physics，by presenting some basic concepts and techniques commonly used in characterizing solid surfaces at a level suitable for senior undergraduate and new graduate students．The aim is to introduce readers to the fundamentals of modern surface science and relevant methodology from a physics perspective．
The book consists of eight chapters． Chapter 1 gives an overview of the subject． Chapters 2, 3 and 4 are mainly concerned with surface atomic structures and the major techniques for structural analysis－electron diffraction and scanning probe microscopy. Chapter 5 deals with surface electronic states．Chapters 6，7 and 8 focus on various electron spectroscopies， Including Auger electron，X－ray and ultraviolet photoelectron spectroscopies for both composition and electron－state analyses．As a text， It is designed for use in a one－semester course，featuring the presentation of simple physical pictures rather than detailed mathematical derivations．The book will also be of interest to scientists and engineers working in any field where an overview of surface analysis is needed．
2.1 Two Dimensional Crystallography
2.1.1 Periodicity and Symmetry of Surface Unit Cell
2.1.2 PointGroup and Plane Group
2.1.3 Nomenclature of Surface Structures
2.1.4 Reciprocal Lattice
2.2 Atomic Structures of Ideal Surfaces
2.2.1 Surface Structures of Metals
2.2.2 Surfaces of Crystalline Compounds and Alloys
3.4 LEED I-V
3.4.1 Experimental and Theoretical I-V Curves
3.4.2 R Factor
3.5 Reflection High Energy Electron Diffraction
3.5.1 Principle
3.5.2 RHEED Analysis
3.5.3 RHEED Intensity Oscillation
3.6 Appendix
3.6.1 Compilation of LEED Patterns
3.6.2 Compilation of RHEED Patterns
Chapter4 Scanning Probe Microscopy
4.1 General Concept
4.2 Scanning Tunneling Microscopy
4.2.1 Basic Principle
4.2.2 Apparatus
4.2.3 WorkingModes and Conditions
4.2.4 STM Imaging
4.2.5 Scanning Tunneling Spectroscopy
4.2.6 STM Nanofabrication and Atom Manipulation
4.3 Atom ic ForceMicroscopy
4.3.1 Principle
4.3.2 Apparatus
4.3.3 WorkingModes of AFM
4.3.4 Lateral Force Microscopy
4.4 Other Types of Scanning Probe Microscopy
4.4.1 Scanning Magnetic Force Microscopy
4.4.2 Scanning Near-field Optical Microscopy
4.4.3 Ballistic Electron Emission Microscopy
Chapter5 Surface Electronic States
5.1 Existence of Localized Electronic States at Surfaces
5.1.1 Bulk States and Surface States
5.1.2 Surface States in One-dimensional Models
5.2 Surface Dangling Bond States
5.2.1 Dangling Bond and Its Hybrid
5.2.2 Dangling Bond States at Reconstructed Surfaces
5.2.3 Dangling Bond States and Fermi Level Pinning
5.3 Adsorbate Induced Electronic States
5.3.1 Adsorption Phenomena
5.3.2 Adsorbate-induced Work Function Changes
5.3.3 Metal-induced Gap States（MIGS）
Chapter6 Auger Electron Spectroscopy
6.1 Principle
6.1.1 Auger Process
6.1.2 Energy of Auger Electron
6.1.3 Yield and Cross-section
6.1.4 Differential Spectra and Count Spectra
7.1 Principle
7.1.1 Three Step Process of Photoemission
7.1.2 Binding Energy
7.2 Apparatus
7.2.1 X-ray Sources
7.2.2 Electron Energy Analyzer
7.2.3 Detectors
7.3 Qualitative Analysis
7.3.1 Energy Calibration
7.3.2 Peak Discrimination
7.3.3 Element Identification
7.4 Quantitative Analysis
7.4.1 Quantification Methods
7.4.2 Background Subtraction
7.4.3 Peak Decomposition
7.4.4 Depth Profile and Depth Information
7.5 Chemical States Studies
7.5.1 Chemical Shift
7.5.2 Charging Effect and Compensation
7.6 Appendix-Electron binding energies of elements in periodic table
Chapter8 Ultra-Violet Photoelectron Spectroscopy
8.1 Principle
8.1.1 UPS versus XPS
8.1.2 Basic Process
8.1.3 Selection Rules and Wavefunction Symmetry
8.2 Light Sources
8.2.1 Discharge Lamp
8.2.2 Monochromator and Polarizer
8.2.3 Special Synchrotron Radiation Sources
8.3 Applications
8.3.1 Identification of Surface Electronic States
8.3.2 Mapping of Surface and Bulk Bands
8.3.3 Identification of Adsorbates:Species and Adsorption Sites
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